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Volume 18 , Issue 2
March/April 2003

Pages 279285


Potential Application of High-Resolution Microfocus X-ray Techniques for Observation of Bone Structure and Bone-Implant Interface

Hideo Kiba, PhD/Tohru Hayakawa, PhD/Shigeo Oba, DVM/Masato Kuwabara, PhD/Isao Habata, DVM/Hirotsugu Yamamoto, DDS, PhD


PMID: 12705308

Purpose: The aim of the present study was to evaluate the potential application of 2 types of microfocus x-ray units to study the bone structure around dental implants and at the bone-implant interface. Materials and Methods: IMZ titanium implants were placed in the maxilla and mandible of a beagle dog. After implantation periods of 1, 2, and 3 months, the bone-implant interface was evaluated with microfocus x-ray computed tomography (CT) and microfocus x-ray fluoroscopy. Results: Microfocus xray CT images of the bone-implant specimen at 3 months after implant placement revealed a clear distinction between the implant and the bone. The implant surface was partially covered with bone, and direct contact between the implant and bone could be clearly seen. Differences in degrees of calcification were identified by the differences in relative black and white intensity. Microfocus x-ray fluoroscopy also showed clear features of the bone and titanium implant. The original drill hole and new bone formation could be recognized. These findings corresponded with traditional histologic observations by light microscopy. Discussion and Conclusion: Microfocus x-ray techniques are non-destructive and require a very short examination time. They are considered useful to observe details of the bone structure and bone-implant interface. Microfocus x-ray fluoroscope and microfocus x-ray CT techniques can provide a clear and distinguishable image of the bone-implant interface because of their high spatial resolution. (INT J ORAL MAXILLOFAC IMPLANTS 2003;18:279285)


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