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Volume 7 , Issue 2
Summer 1992

Pages 151-160

Visualization and Initial Characterization of the Titanium Boundary of the Bone-Implant Interface of Osseointegrated Implants

Thomas W. Budd, PhD/Kuniteru Nagahara, DDS, PhD/Kenneth L. Bielat, PhD/ Michael A. Meenaghan, DDS, PhD/Norman G. Schaaf, DDS

PMID: 1398831

A simple procedure has allowed consistent visualization of the titanium boundary of the bone-implant interface of osseointegrated titanium implants at the electron microscope level. This was accomplished by embedding the intact bone-implant specimen block with low-viscosity resin prior to removal of the device in preparation for sectioning. The titanium boundary consisted of either a thin, compact amorphous electron dense layer, a broad layer of dense amorphous granules, or both. This material was removed by decalcification in formic acid (prior to embedding) and did not diffract electrons (ie, was noncrystalline). Scanning-transmission electron microscopy-EDX analysis indicated the presence of titanium, calcium, and phosphorus in the electron dense material. Field emission scanning electron microscopy-EDX dot-mapping analysis confirmed the presence of these elements and mapped them to the same locations at the implant-interface boundary. (INT J ORAL MAXILLOFAC IMPLANTS 1992;7:151-160.)

Key words: healing, implants, interface, osseointegration, titanium

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