Share Page:

Volume 5 , Issue 3
Fall 1990

Pages 264-271

Oxide Thickness and Surface Contamination of Six Endosseous Dental Implants Determined by Electron Spectroscopy for Chemical Analysis: A Preliminary Report

Craig Klauber, PhD/Lawrence J. Lenz, DDS, BS, MS/Patrick J. Henry, BDSc, MSD, FRACDS

PMID: 2098329

Electron spectroscopy and argon ion etching were used to determine the depth and composition of the oxide layers of six competitive dental implant systems. To minimize problems associated with analyzing the active oxide layers, the implants were removed from their original packaging in an oxygen-free environment. The majority of the six implant systems were found to have similar oxide thicknesses in the range of 20 to 34 . Some variation was found in the extent of non-oxide surface contamination. ( ORAL MAXILLOFAC IMPLANTS 1990;5;264-271.)

Key words: dental implants, electron spectroscopy, oxide layer, titanium

Full Text PDF File | Order Article


Get Adobe Reader
Adobe Acrobat Reader is required to view PDF files. This is a free program available from the Adobe web site.
Follow the download directions on the Adobe web site to get your copy of Adobe Acrobat Reader.


© 2015 Quintessence Publishing Co, Inc JOMI Home
Current Issue
Ahead of Print
Author Guidelines
Accepted Manuscripts
Submission Form
Quintessence Home
Terms of Use
Privacy Policy
About Us
Contact Us