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Volume 2 , Issue 1
Spring 1987
Pages 23-27

Comparative Surface Analysis of Two Osseointegrated Implant Systems

Patrick J. Henry, B.D.Sc., M.S.D., F.R.A.C.D.S.

PMID: 3471711

Scanning electron microscopy and spectral surface analysis were used to compare and contrast the microstructure of two osseointegrated implant systems. Results suggested that one system was superior to the other in terms of surface quality, definition, and reproducibility.

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