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Volume 13 , Issue 2
March/April 1998
Pages 197–203

Dosimetric Measurement of Scattered Radiation From Dental Implants in Simulated Head and Neck Radiotherapy

Russell Wang, DDS, MSD, Kunjan Pillai, PhD, Paul K. Jones, PhD.

PMID: 9581405

The purpose of this study was to examine the dose enhancement at bone-implant interfaces from scattered radiation during simulated head and neck radiotherapy. Three cylindric implant systems with different compositions (pure titanium, titanium-aluminum-vanadium alloy, titanium coated with hydroxyapatite) and a high gold content transmandibular implant system (gold-copper-silver alloy) were studied. Extruded lithium fluoride single crystal chips were used as thermoluminescent material to measure radiation dose enhancement at 0, 1, and 2 mm from the bone-implant interface. The relative doses in buccal, lingual, mesial, and distal directions were also recorded and compared. The results indicated that the highest dose enhancement occurred at a distance of 0 mm from the bone-implant interface for all the implant systems studied. The transmandibular implants had higher scattered radiation than other groups at 0 mm and at 1 mm from the bone-implant interface. There was no significant difference of dose enhancement between buccal, lingual, mesial, and distal directions. Titanium implants coated with hydroxyapatite demonstrated the best results under the simulated irradiation. (INT J ORAL MAXILLOFAC IMPLANTS 1998;13:197–203) Key words: bone-implant interface, head and neck radiotherapy, scattered radiation, thermoluminescent dosimetry (TLD), titanium implant, transmandibular implant system

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